| Title | Value analysis tear-down : a new process for product development and innovation |
|---|---|
| Author | Kaufman, J. Jerry; Sato, Yoshihiko |
| Year | 2005 |
| Edition | 1st ed |
| Volume | |
| Series | |
| Publisher | Industrial Press, Society of Manufacturing Engineers |
| City | New York |
| Language | English |
Size: 8.81MB | Pages: 206 |
LLC: N/A | DDC:
