| Title | VLSI testing : digital and mixed analogue/digital techniques |
|---|---|
| Author | Hurst, Stanley Leonard |
| Year | 1998 |
| Edition | 1 |
| Volume | |
| Series | IEE circuits and systems series 9 |
| Publisher | Institution of Electrical Engineers |
| City | London |
| Language | English |
Size: 28.59MB | Pages: 532 |
LLC: N/A | DDC:
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